S. Shiratake, T. Miyakawa, Y. Takeuchi, R. Ogiwara, M. Kamoshida, K. Hoya, K. Oikawa, T. Ozaki, I. Kunishima, K. Yamakawa, S. Sugimoto, D. Takashima, H. Joachim, N. Rehm, J. Wohlfahrt, N. Nagel, G. Beitel, M. Jacob, T. Roehr
{"title":"A 32Mb chain FeRAM with segment/stitch array architecture","authors":"S. Shiratake, T. Miyakawa, Y. Takeuchi, R. Ogiwara, M. Kamoshida, K. Hoya, K. Oikawa, T. Ozaki, I. Kunishima, K. Yamakawa, S. Sugimoto, D. Takashima, H. Joachim, N. Rehm, J. Wohlfahrt, N. Nagel, G. Beitel, M. Jacob, T. Roehr","doi":"10.1109/ISSCC.2003.1234302","DOIUrl":null,"url":null,"abstract":"A 96mm/sup 2/, 32Mb chain FeRAM in 0.20/spl mu/m 3M CMOS and stacked capacitor technology is described. Cell efficiency of 65.6% is realized by compact memory cell structure and segment/stitch WL architecture. The word line power-on/off sequence protects the data from startup noise. A 3/spl mu/A standby current bias generator and compatible access mode SRAM are implemented for mobile applications.","PeriodicalId":171288,"journal":{"name":"2003 IEEE International Solid-State Circuits Conference, 2003. Digest of Technical Papers. ISSCC.","volume":"6 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-10-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2003 IEEE International Solid-State Circuits Conference, 2003. Digest of Technical Papers. ISSCC.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSCC.2003.1234302","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 10
Abstract
A 96mm/sup 2/, 32Mb chain FeRAM in 0.20/spl mu/m 3M CMOS and stacked capacitor technology is described. Cell efficiency of 65.6% is realized by compact memory cell structure and segment/stitch WL architecture. The word line power-on/off sequence protects the data from startup noise. A 3/spl mu/A standby current bias generator and compatible access mode SRAM are implemented for mobile applications.