AppliedPRO: process recipe optimizer for R&D acceleration and beyond

Deepak Gupta, Sravan Nandakumar, T. Miyagi, Oliver Jan, W. Bishara, St Chiou, Kyeong-tae Lee, Andre Kim, Sangdoo Kim, Young-Soo Um, Ki-il Kim, Changbae Park, Myeonggil Shin, K. Bai
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Abstract

Semiconductor process development for state-of-the-art devices is a complex task that requires up to years of development. The complexity comes from the need to tune a significant number of process knobs in latest process tools, to meet multiple on-wafer performance targets, across an entire wafer. AppliedPRO® is a software and library of algorithms developed by Applied Materials for process recipe optimization to meet simultaneous process requirements across the entire wafer. The software is tailored to semiconductor use-cases and designed to be primarily used by process engineers to make critical decisions with confidence during process development. Over 100 use-cases have been generated for various semiconductor chips manufacturers, showing faster development time, less development resources, and higher process engineer productivity. This paper shows the use-case of Samsung N+1 Logic BEOL Spacer-Etch process recipe optimization using AppliedPRO®. We utilized AppliedPRO® structured design of experiment methodology and machine-learning algorithms to simultaneously model 10 process-recipe knobs of Applied Materials’ Centris® Sym3® X Etch system and their effect on 8 on-wafer metrics, and determine optimal process knob conditions for minimizing Spacer-tail, which is a key performance metric, while keeping other metrics close to spec. These optimized conditions reduced Spacer-tail by 73% on coupons, which was also validated on full-wafer. These optimal results were previously unachievable in all the previous experimental trials before introducing AppliedPRO®.
AppliedPRO:用于研发加速和超越的工艺配方优化器
用于最先进设备的半导体工艺开发是一项复杂的任务,需要长达数年的开发。复杂性来自于需要在最新的工艺工具中调整大量的工艺旋钮,以满足整个晶圆上的多个晶圆性能目标。AppliedPRO®是应用材料公司开发的一种软件和算法库,用于工艺配方优化,以满足整个晶圆的同步工艺要求。该软件是为半导体用例量身定制的,主要用于工艺工程师在工艺开发过程中自信地做出关键决策。已经为各种半导体芯片制造商生成了超过100个用例,显示出更快的开发时间、更少的开发资源和更高的过程工程师生产力。本文展示了使用AppliedPRO®优化三星N+1 Logic BEOL Spacer-Etch工艺配方的用例。我们利用AppliedPRO®结构化设计的实验方法和机器学习算法,同时模拟了应用材料公司Centris®Sym3®X蚀刻系统的10个工艺配方旋钮及其对8个晶圆上指标的影响,并确定了最小化间隔尾的最佳工艺旋钮条件,这是一个关键的性能指标,同时保持其他指标接近规格。这些优化条件减少了73%的间隔尾,这也在整片晶圆上得到了验证。在引入AppliedPRO®之前,这些最佳结果在之前的所有实验试验中都是无法实现的。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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