Giant figure of merit (ZT) of Ge2Sb2Te5 thin films through the control of crystal structure

So-Hyeon Kang, S. Pammi, Sang‐Kwon Lee, Soon-Gil Yoon
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引用次数: 1

Abstract

300nm-thick Ge2Sb2Te5 Thin Films were prepared using RF sputtering with different deposition temperatures. Thermoelectric properties of GST thin films were measured at room temperature including the Seebeck coefficient, the electrical conductivity and thermal conductivity. The highest power factor (1.1 × 10-3 W/K2m) was shown in the GST film deposited at 250°C, which has the mixture phases of FCC and HCP structure. And the moderate degree of electrical conductivity and the Seebeck coefficient in the GST film deposited at 250°C lead to the highest ZT value of nearly 2.0. In order to explain giant ZT value, the crystal structure, the electrical parameters and the chemical composition were investigated.
通过晶体结构控制Ge2Sb2Te5薄膜的巨优值(ZT)
采用射频溅射技术,在不同沉积温度下制备了300nm厚的Ge2Sb2Te5薄膜。在室温下测量了GST薄膜的热电性能,包括塞贝克系数、电导率和导热系数。在250℃下沉积的GST膜具有FCC和HCP结构的混合相,功率因数最高(1.1 × 10-3 W/K2m)。而在250℃沉积的GST薄膜的电导率和塞贝克系数适中,ZT值最高,接近2.0。为了解释巨ZT值,对其晶体结构、电学参数和化学成分进行了研究。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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