{"title":"Impact of simulation parameters on critical area analysis","authors":"J. Segal, S. Bakarian, R. Ross","doi":"10.1109/DFTVS.1999.802864","DOIUrl":null,"url":null,"abstract":"Monte Carlo critical area extraction routines are controlled by a number of parameters that impact the accuracy and speed of the simulation. In this paper, the effects of the following parameters are explored experimentally: defect shape, rounding of corners in the layout, merging of redundant contacts, consideration of the netlist extracted from layout, and varying the number of defects simulated.","PeriodicalId":448322,"journal":{"name":"Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (EFT'99)","volume":"48 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (EFT'99)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DFTVS.1999.802864","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
Monte Carlo critical area extraction routines are controlled by a number of parameters that impact the accuracy and speed of the simulation. In this paper, the effects of the following parameters are explored experimentally: defect shape, rounding of corners in the layout, merging of redundant contacts, consideration of the netlist extracted from layout, and varying the number of defects simulated.