Meriam Kallel, Younes Lahbib, R. Tourki, A. Baganne
{"title":"Aspect-based ABV for SystemC transaction level models","authors":"Meriam Kallel, Younes Lahbib, R. Tourki, A. Baganne","doi":"10.1109/ICM.2009.5418623","DOIUrl":null,"url":null,"abstract":"Transaction level modeling (TLM) is increasingly being adopted to describe hardware designs at high abstraction levels. This paper proposes a framework that targets the assertion-based verification (ABV) of SystemC transaction level models during simulation. Aspect-oriented (AO) mechanisms are exploited to write temporal properties that fit TLM requirements. No modifications are needed in the design's SystemC code. Functional as well as performance properties are addressed. We demonstrate the effectiveness of our approach on TLM 2.0 standard compliant models.","PeriodicalId":391668,"journal":{"name":"2009 International Conference on Microelectronics - ICM","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 International Conference on Microelectronics - ICM","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICM.2009.5418623","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6
Abstract
Transaction level modeling (TLM) is increasingly being adopted to describe hardware designs at high abstraction levels. This paper proposes a framework that targets the assertion-based verification (ABV) of SystemC transaction level models during simulation. Aspect-oriented (AO) mechanisms are exploited to write temporal properties that fit TLM requirements. No modifications are needed in the design's SystemC code. Functional as well as performance properties are addressed. We demonstrate the effectiveness of our approach on TLM 2.0 standard compliant models.