Embedded tutorial 3: Statistical learning for analog circuit testing

Abstract

The test cost per transistor in integrated circuits (IC) has remained practically steady during the past decades, unlike the manufacturing cost per transistor which is gradually being reduced. In recent years, there have been anecdotal cases where the test cost actually surpasses the overall manufacturing cost. To this end, test cost reduction is a significant driving force for the deployment of ICs in a wider range of applications for the broad public. It is also a fact that the cost for testing the analog portions of an IC can amount up to 50% of the total test cost, despite that analog circuits occupy typically less than 5% of the die area. This shows that analog test is in the coming years an area for industry focus, innovation and improvement.