Parameterized test patterns methodology for layout design rule checking verification

M. Tantawy, R. Guindi, M. Dessouky, M. Al-Imam
{"title":"Parameterized test patterns methodology for layout design rule checking verification","authors":"M. Tantawy, R. Guindi, M. Dessouky, M. Al-Imam","doi":"10.1109/ICECS.2015.7440385","DOIUrl":null,"url":null,"abstract":"Design rules verification is an essential stage in the Process Design Kit (PDK) release for any fab. Since achieving high yield is the target of any fab, the design rules should ensure this. Design rules violations happening after fabrication lead to disastrous results on the mask sets as well as increased cost and delayed schedules. Here comes the importance of verifying these design rules and making sure that they represent the process in a manner that achieves a high yield and detects design rules issues early on. The verification process consumes 60% of the release cycle and the most time consuming step in the process is the Design rules checking (DRC) verification. Advanced technology nodes introduced stricter design rules as well as new design techniques, which added more complexity to the design rules development and verification. This paper presents a novel flow for automating the most time consuming part of the (DRC) rule decks verification, which is test cases creation and allows users to enhance the quality of the verification process and increase the testing coverage as well. And eventually reduces the time consumed in verification to 26% of what it was using conventional verification methods.","PeriodicalId":215448,"journal":{"name":"2015 IEEE International Conference on Electronics, Circuits, and Systems (ICECS)","volume":"78 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE International Conference on Electronics, Circuits, and Systems (ICECS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICECS.2015.7440385","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5

Abstract

Design rules verification is an essential stage in the Process Design Kit (PDK) release for any fab. Since achieving high yield is the target of any fab, the design rules should ensure this. Design rules violations happening after fabrication lead to disastrous results on the mask sets as well as increased cost and delayed schedules. Here comes the importance of verifying these design rules and making sure that they represent the process in a manner that achieves a high yield and detects design rules issues early on. The verification process consumes 60% of the release cycle and the most time consuming step in the process is the Design rules checking (DRC) verification. Advanced technology nodes introduced stricter design rules as well as new design techniques, which added more complexity to the design rules development and verification. This paper presents a novel flow for automating the most time consuming part of the (DRC) rule decks verification, which is test cases creation and allows users to enhance the quality of the verification process and increase the testing coverage as well. And eventually reduces the time consumed in verification to 26% of what it was using conventional verification methods.
布局设计规则检验验证的参数化测试模式方法
设计规则验证是任何晶圆厂工艺设计套件(PDK)发布的重要阶段。由于实现高良率是任何晶圆厂的目标,设计规则应确保这一点。在制作后违反设计规则会导致面具套装的灾难性后果,以及成本的增加和进度的延迟。验证这些设计规则并确保它们以一种能够实现高产量的方式表示流程并及早检测设计规则问题的重要性就体现出来了。验证过程占用了发布周期的60%,其中最耗时的步骤是DRC (Design rules checking)验证。先进的技术节点引入了更严格的设计规则和新的设计技术,这增加了设计规则开发和验证的复杂性。本文提出了一种新的流程,用于自动化(DRC)规则甲板验证中最耗时的部分,即测试用例的创建,并允许用户提高验证过程的质量并增加测试覆盖率。并最终将验证所消耗的时间减少到使用传统验证方法的26%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信