Diffusion of Phosphorus in Silicon Thin Films by Spin and Dip Coating

A. D. Pene, B. Hartiti, L. Bitjoka, G. Nkeng, C. Kapseu, P. Thevenin
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Abstract

In this work, Spin coating and Dip coating techniques are used for the diffusion of phosphorus in silicon in order to realize the emitter of a silicon solar cell which is a very important and critical step in photovoltaic technology. Several techniques are used for the realization of n+p junctions among which the ionic implantation, vapor phase diffusion and diffusion from solid sources are the most common. In this work, the emitter is made by diffusion of solid doping sources that we elaborated by the sol gel method associated with spin coating and dip coating on silicon wafers. The doping solutions were prepared by the sol gel method using tetraethoxysilane "TEOS" and methyltriethoxysilane "MTEOS" and phosphoric acid H3PO4 as a precursor by emulsion of phosphoric acid in isopropanol. This experience allowed us to study the electrical properties of the emitters using the four-point technique. The measurement results showed that the values of the sheet resistance R□ obtained by dip coating are comparable to those obtained with the spin coating technique.
磷在硅薄膜中的自旋和浸渍扩散
本文采用自旋镀膜和浸渍镀膜技术对硅中的磷进行扩散,以实现硅太阳电池的发射极,这是光伏技术中非常重要和关键的一步。实现n+p结的方法有几种,其中离子注入、气相扩散和固体源扩散是最常用的方法。在这项工作中,发射极是由固体掺杂源扩散制成的,我们用溶胶凝胶法结合自旋涂层和浸渍涂层在硅片上进行了阐述。以四乙氧基硅烷“TEOS”和甲基三乙氧基硅烷“MTEOS”为原料,磷酸H3PO4为前驱体,以磷酸在异丙醇中的乳液为原料,采用溶胶-凝胶法制备掺杂溶液。这一经验使我们能够使用四点技术研究发射体的电学特性。测量结果表明,浸涂法获得的薄片电阻R□值与旋涂法获得的电阻R□值相当。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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