{"title":"A 16ns CMOS EEPLA with reprogrammable architecture","authors":"D. Rutledge, J. Turner, R. Darling, G. Josephson","doi":"10.1109/ISSCC.1986.1156977","DOIUrl":null,"url":null,"abstract":"A PLA, whose architecture may be electrically programmed, will be described. The device has been built in 1.2μm EEPROM technology and operates at 20MHz with 380mW dissipation. On-chip scan diagnostics are used for testing.","PeriodicalId":440688,"journal":{"name":"1986 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","volume":"2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1986 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSCC.1986.1156977","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
A PLA, whose architecture may be electrically programmed, will be described. The device has been built in 1.2μm EEPROM technology and operates at 20MHz with 380mW dissipation. On-chip scan diagnostics are used for testing.