Highly Manufacturable Single-Bridge-Channel MOSFET (SBCFET)

S. Lee, Min-Sang Kim, E. Yoon, Sung-min Kim, Lian Jun, Dong-Won Kim, Donggun Park
{"title":"Highly Manufacturable Single-Bridge-Channel MOSFET (SBCFET)","authors":"S. Lee, Min-Sang Kim, E. Yoon, Sung-min Kim, Lian Jun, Dong-Won Kim, Donggun Park","doi":"10.1109/ICICDT.2006.220811","DOIUrl":null,"url":null,"abstract":"Modifying the multi-bridge-channel MOSFET (MBCFET) process, we have successfully fabricated single-bridge-channel MOSFET (SBCFET). Due to reduced epitaxial growth steps and simple ion implantation process, the SBCFET has manufacture-worthy simple fabrication process like conventional planar transistor. The current drivability of SBCFET shows 2.0 mA/mum @ 100 pA/mum off-current in 1.0 V operation","PeriodicalId":447050,"journal":{"name":"2006 IEEE International Conference on IC Design and Technology","volume":"40 5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-08-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 IEEE International Conference on IC Design and Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICICDT.2006.220811","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3

Abstract

Modifying the multi-bridge-channel MOSFET (MBCFET) process, we have successfully fabricated single-bridge-channel MOSFET (SBCFET). Due to reduced epitaxial growth steps and simple ion implantation process, the SBCFET has manufacture-worthy simple fabrication process like conventional planar transistor. The current drivability of SBCFET shows 2.0 mA/mum @ 100 pA/mum off-current in 1.0 V operation
高度可制造的单桥通道MOSFET (SBCFET)
通过对多桥通道MOSFET (MBCFET)工艺的改进,成功制备了单桥通道MOSFET (SBCFET)。由于减少了外延生长步骤和简单的离子注入工艺,SBCFET具有与传统平面晶体管一样具有制造价值的简单制造工艺。SBCFET的电流可驱动性在1.0 V工作时显示2.0 mA/mum @ 100 pA/mum的关断电流
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