{"title":"Compound properties in correlation to dynamic-mechanical measurements of process regulated molding technology","authors":"G. Draeger, M. Maier, F. Quella","doi":"10.1109/EEMTS.1988.75949","DOIUrl":null,"url":null,"abstract":"The increasing demand for better reliability of encapsulated VLSI requires process-regulated manufacturing, which includes the rheology of materials and the design of the tool. Some typical examples for the optimization are given. For an evaluation of stress formation by different molding compounds, the suitability of shear modulus and thermal expansion, especially of their product vs. temperature, is discussed. The limitations of these values are shown and do some suggestions for the extension of the measurements e.g. to aging are made.<<ETX>>","PeriodicalId":137899,"journal":{"name":"Fourth IEEE/CHMT European International Electronic Manufacturing Technology Symposium","volume":"15 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1988-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Fourth IEEE/CHMT European International Electronic Manufacturing Technology Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EEMTS.1988.75949","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
The increasing demand for better reliability of encapsulated VLSI requires process-regulated manufacturing, which includes the rheology of materials and the design of the tool. Some typical examples for the optimization are given. For an evaluation of stress formation by different molding compounds, the suitability of shear modulus and thermal expansion, especially of their product vs. temperature, is discussed. The limitations of these values are shown and do some suggestions for the extension of the measurements e.g. to aging are made.<>