Scaling trends of cosmic ray induced soft errors in static latches beyond 0.18 /spl mu/

2001 Symposium on VLSI Circuits. Digest of Technical Papers (IEEE Cat. No.01CH37185) Pub Date : 2001-06-14 DOI:10.1109/VLSIC.2001.934195

T. Karnik, B. Bloechel, Krishnamurthy Soumyanath, Vivek De, S. Borkar

引用次数: 137

Abstract

This paper describes an experiment to characterize soft error rate of static latches for neutrons using a neutron beam, with measured soft error rates as a function of diffusion collection areas and supply voltages. The paper also quantifies the effectiveness of two promising hardening techniques and scaling trends.

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宇宙射线致静态锁存器软误差超过0.18 /spl mu/的标度趋势

本文描述了一个用中子束表征中子静态锁存器软错误率的实验，测量的软错误率是扩散收集面积和电源电压的函数。本文还量化了两种有前途的硬化技术的有效性和结垢趋势。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

2001 Symposium on VLSI Circuits. Digest of Technical Papers (IEEE Cat. No.01CH37185)

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