Muhammad Hassan, Daniel Große, T. Vörtler, K. Einwich, R. Drechsler
{"title":"Functional Coverage-Driven Characterization of RF Amplifiers","authors":"Muhammad Hassan, Daniel Große, T. Vörtler, K. Einwich, R. Drechsler","doi":"10.1109/FDL.2019.8876957","DOIUrl":null,"url":null,"abstract":"In this paper we propose the first functional coverage-driven characterization approach as a systematic solution for the class of Radio Frequency (RF) amplifiers. We elevate the main concepts of digital functional coverage to the context of SystemC AMS in particular, and system-level simulations in general. To enable AMS functional coverage-driven characterization, we introduce two coverage refinement parameters on input and output side, to systematically generate input stimuli and capture specifications. At the heart of the approach is the coverage analysis which measures the functional coverage of the DUV and provides clear feedback to reach coverage closure. We provide a case study using an industrial RF transmitter and receiver model to demonstrate the applicability and efficacy of our approach.","PeriodicalId":162747,"journal":{"name":"2019 Forum for Specification and Design Languages (FDL)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 Forum for Specification and Design Languages (FDL)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/FDL.2019.8876957","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 11
Abstract
In this paper we propose the first functional coverage-driven characterization approach as a systematic solution for the class of Radio Frequency (RF) amplifiers. We elevate the main concepts of digital functional coverage to the context of SystemC AMS in particular, and system-level simulations in general. To enable AMS functional coverage-driven characterization, we introduce two coverage refinement parameters on input and output side, to systematically generate input stimuli and capture specifications. At the heart of the approach is the coverage analysis which measures the functional coverage of the DUV and provides clear feedback to reach coverage closure. We provide a case study using an industrial RF transmitter and receiver model to demonstrate the applicability and efficacy of our approach.