Creating simple driver models with device I-V curves

Abstract

A method for simulating driver performance using the characteristic static output current curves for a low state (I/sub OL/) and high state (I/sub OH/) is presented. It offers a simplified alternative to complex theoretical models. This approach can be used to quickly evaluate the impact of a change in driver output on system performance, to determine the worst case performance, or to correlate experiments directly with a given test device. It requires that the I/sub OL/ and I/sub OH/, and the intrinsic transient time for the device be known. This information can be determined by measuring hardware, analyzing the output of a theoretical model, or summarizing data sheets.<>