{"title":"A Normally-off P-Gate AlGaN/GaN HEMT for High Power Application","authors":"Ninggang Dong, Meihua Liu, Limeng Shi, Xinnan Lin","doi":"10.1109/EDSSC.2018.8487132","DOIUrl":null,"url":null,"abstract":"In this paper, a novel normally-off p-GaN gate AlGaN/GaN HEMT on AlGaN buffer with an InGaN layer inserted between GaN channel and AlGaN buffer is proposed and investigated by Sentaurus TCAD simulation tool. A higher drain current (lower $\\mathrm {R}_{\\mathrm{on}})$ in the on-state and higher breakdown voltage $( \\mathrm {V}_{\\mathrm{Br}})$ are achieved simultaneously. The ${\\mathrm {V}_{\\mathrm{Br}}}^{2}/ \\mathrm {R}_{\\mathrm{on}}$ is increased by 34.8%.","PeriodicalId":279745,"journal":{"name":"2018 IEEE International Conference on Electron Devices and Solid State Circuits (EDSSC)","volume":"146 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE International Conference on Electron Devices and Solid State Circuits (EDSSC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EDSSC.2018.8487132","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
In this paper, a novel normally-off p-GaN gate AlGaN/GaN HEMT on AlGaN buffer with an InGaN layer inserted between GaN channel and AlGaN buffer is proposed and investigated by Sentaurus TCAD simulation tool. A higher drain current (lower $\mathrm {R}_{\mathrm{on}})$ in the on-state and higher breakdown voltage $( \mathrm {V}_{\mathrm{Br}})$ are achieved simultaneously. The ${\mathrm {V}_{\mathrm{Br}}}^{2}/ \mathrm {R}_{\mathrm{on}}$ is increased by 34.8%.