A Normally-off P-Gate AlGaN/GaN HEMT for High Power Application

Ninggang Dong, Meihua Liu, Limeng Shi, Xinnan Lin
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Abstract

In this paper, a novel normally-off p-GaN gate AlGaN/GaN HEMT on AlGaN buffer with an InGaN layer inserted between GaN channel and AlGaN buffer is proposed and investigated by Sentaurus TCAD simulation tool. A higher drain current (lower $\mathrm {R}_{\mathrm{on}})$ in the on-state and higher breakdown voltage $( \mathrm {V}_{\mathrm{Br}})$ are achieved simultaneously. The ${\mathrm {V}_{\mathrm{Br}}}^{2}/ \mathrm {R}_{\mathrm{on}}$ is increased by 34.8%.
一种大功率常关p栅AlGaN/GaN HEMT
本文提出了一种新型的常关p-GaN栅极AlGaN/GaN HEMT,并在GaN通道和AlGaN缓冲器之间插入InGaN层,通过Sentaurus TCAD仿真工具进行了研究。在导通状态下可以同时获得较高的漏极电流(较低的$\mathrm {R}_{\mathrm{on}})和较高的击穿电压($\mathrm {V}_{\mathrm{Br}})。V $ {\ mathrm {} _ {\ mathrm {Br}}} ^ {2} / \ mathrm {R} _ {\ mathrm{在}}是美元增加了34.8%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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