Enhanced crosstalk fault model and methodology to generate tests for arbitrary inter-core interconnect topology

Wichian Sirisaengtaksin, S. Gupta
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引用次数: 16

Abstract

In this paper we develop a new fault model for capacitive crosstalk in inter-core interconnects. We also develop a framework to generate compact tests for interconnects with arbitrary topologies. Experimental results show that the proposed approach can significantly reduce test application time for large interconnects. We are in the process of extending the framework to interconnects that include tri-state as well as bi-directional nets.
改进的串扰故障模型和生成任意核间互连拓扑测试的方法
本文建立了一种新的电容串扰故障模型。我们还开发了一个框架来生成具有任意拓扑的互连的紧凑测试。实验结果表明,该方法可以显著减少大型互连的测试应用时间。我们正在将框架扩展到包括三态和双向网络在内的互联。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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