Statistical characterization of radiation-induced pulse waveforms and flip-flop soft errors in 14nm tri-gate CMOS using a back-sampling chain (BSC) technique
Saurabh Kumar, M. Cho, L. Everson, Hoonki Kim, Qianying Tang, Paul R. Mazanec, P. Meinerzhagen, Andres F. Malavasi, D. Lake, Carlos Tokunaga, H. Quinn, M. Khellah, J. Tschanz, S. Borkar, V. De, C. Kim
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Abstract
A novel BSC circuit with tunable current starved buffers demonstrates higher sensitivity, scalability & accurate statistical characterization of radiation-induced SET pulse waveforms & flip-flop SER in 14nm tri-gate CMOS, thus enabling improved SER estimation & analysis for a range of supply voltages including NTV.
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