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Surface Deftct Inspection For Small Sizes Of Chip- Electronic-Parts Applying Color lmage Analysis Techniques

Proceedings of Japan International Electronic Manufacturing Technology Symposium Pub Date : 1993-06-09 DOI:10.1109/IEMT.1993.639775
K. Tanigichi, S. Nagata, Xu Xiaolin, T. Uno, H. Yamamoto, T. Seki, S. Kawabata, N. Yamana
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应用彩色图像分析技术的小尺寸芯片电子零件表面缺陷检测
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Proceedings of Japan International Electronic Manufacturing Technology Symposium
Proceedings of Japan International Electronic Manufacturing Technology Symposium
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