A new method for comparing migration abilities of conductor systems based on conventional electroanalytical techniques

2000 Proceedings. 50th Electronic Components and Technology Conference (Cat. No.00CH37070) Pub Date : 2000-05-21 DOI:10.1109/ECTC.2000.853443

G. Harsányi, G. Inzelt

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引用次数: 5

Abstract

There are various metallization types, pure metals as well as alloys, showing very different abilities for migration. Their comparison is available only through empirical way. There are two main possibilities for getting information or comparison about the migration behavior of a sample: the water drop test and accelerated climatic tests. The results are generally uncertain showing large spreading and can only be interpreted with difficulties. Further problems are the undefined conditions and many subjective things with the Water Drop (WD) test while rather long periods of tests and special test chambers are necessary to perform climatic tests. A third method has been developed and will be presented in the paper for testing metallization systems based on a powerful technique; this is the very well known cyclic voltammetry used in the electroanalytical chemistry. The results indicate an effective method for making quick comparison between metallization systems in connection with their migration abilities.

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一种基于传统电分析技术比较导体系统迁移能力的新方法

有各种金属化类型，纯金属和合金，表现出非常不同的迁移能力。它们的比较只能通过经验的方式进行。获取样本迁移行为的信息或比较有两种主要的可能性:水滴试验和加速气候试验。结果通常是不确定的，显示出很大的传播，只能用困难来解释。进一步的问题是不明确的条件和许多主观的东西与水滴(WD)试验，而相当长的试验周期和特殊的试验室进行气候试验是必要的。第三种方法已经开发并将在本文中介绍，用于基于一种强大的技术测试金属化系统;这就是众所周知的电分析化学中使用的循环伏安法。结果表明了一种快速比较金属化体系迁移能力的有效方法。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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2000 Proceedings. 50th Electronic Components and Technology Conference (Cat. No.00CH37070)

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