{"title":"Optimization of the MPS rectifier via variation of Schottky region area","authors":"Shen-Hang Tu, B. J. Baliga","doi":"10.1109/ISPSD.1991.146078","DOIUrl":null,"url":null,"abstract":"The authors discuss the optimization of the switching characteristics of the MPS (merged PIN/Schottky) rectifier by varying the relative area of the P-N junction and Schottky regions. Extensive two-dimensional numerical simulations have been performed of the forward condition and reverse recovery switching characteristics. It has been found that a trade-off curve between the forward voltage drop and the reverse recovery time can be obtained by varying the area of the Schottky region, while maintaining a constant minority carrier lifetime. This trade-off curve is superior to that obtained for the PIN rectifier using lifetime control. Experimental data that corroborate this theoretical prediction have been obtained by fabrication of 700 V devices. This method of performing the trade-off between the forward drop and the turn-off time has the advantage that it can be done by device design without the problems and additional processing cost associated with lifetime control.<<ETX>>","PeriodicalId":127986,"journal":{"name":"[1991] Proceedings of the 3rd International Symposium on Power Semiconductor Devices and ICs","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-04-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"[1991] Proceedings of the 3rd International Symposium on Power Semiconductor Devices and ICs","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISPSD.1991.146078","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5
Abstract
The authors discuss the optimization of the switching characteristics of the MPS (merged PIN/Schottky) rectifier by varying the relative area of the P-N junction and Schottky regions. Extensive two-dimensional numerical simulations have been performed of the forward condition and reverse recovery switching characteristics. It has been found that a trade-off curve between the forward voltage drop and the reverse recovery time can be obtained by varying the area of the Schottky region, while maintaining a constant minority carrier lifetime. This trade-off curve is superior to that obtained for the PIN rectifier using lifetime control. Experimental data that corroborate this theoretical prediction have been obtained by fabrication of 700 V devices. This method of performing the trade-off between the forward drop and the turn-off time has the advantage that it can be done by device design without the problems and additional processing cost associated with lifetime control.<>