An IEEE 1500 compatible wrapper architecture for testing cores at transaction level

F. Refan, P. Prinetto, Z. Navabi
{"title":"An IEEE 1500 compatible wrapper architecture for testing cores at transaction level","authors":"F. Refan, P. Prinetto, Z. Navabi","doi":"10.1109/EWDTS.2008.5580141","DOIUrl":null,"url":null,"abstract":"With the evolution of Electronic System Level (ESL) design methodologies, Transaction Level Modeling (TLM) is regarded as the next step in the direction of system level design. This requires definition of appropriate test strategies at this level including wrapper, scheduling and Test Access Mechanism (TAM) design. In this paper we propose a wrapper for core testing at transaction level, compatible with IEEE 1500 standard architecture. The proposed wrapper is designed to support communication with tlm_fifo as the basic primitive channel of SystemC TLM core. The wrapper is defined as a layer on top of standard IEEE 1500 architecture, including a controller to packetize and depacketize the test stimuli and responses. Controller design, and architecture configuration for serial and parallel core test instructions are presented. Using the same strategy other instructions can be implemented.","PeriodicalId":292944,"journal":{"name":"Proceedings of IEEE East-West Design & Test Symposium (EWDTS'08)","volume":"12 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of IEEE East-West Design & Test Symposium (EWDTS'08)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EWDTS.2008.5580141","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

With the evolution of Electronic System Level (ESL) design methodologies, Transaction Level Modeling (TLM) is regarded as the next step in the direction of system level design. This requires definition of appropriate test strategies at this level including wrapper, scheduling and Test Access Mechanism (TAM) design. In this paper we propose a wrapper for core testing at transaction level, compatible with IEEE 1500 standard architecture. The proposed wrapper is designed to support communication with tlm_fifo as the basic primitive channel of SystemC TLM core. The wrapper is defined as a layer on top of standard IEEE 1500 architecture, including a controller to packetize and depacketize the test stimuli and responses. Controller design, and architecture configuration for serial and parallel core test instructions are presented. Using the same strategy other instructions can be implemented.
一个IEEE 1500兼容的封装架构,用于在事务级别测试核心
随着电子系统级(ESL)设计方法的发展,事务级建模(TLM)被认为是系统级设计的下一步。这需要在这个级别定义适当的测试策略,包括包装器、调度和测试访问机制(TAM)设计。本文提出了一种兼容ieee1500标准架构的事务级核心测试封装器。所提出的包装器旨在支持与tlm_fifo作为SystemC TLM核心的基本原始通道的通信。包装器被定义为标准IEEE 1500体系结构之上的一层,包括一个对测试刺激和响应进行分组和解分组的控制器。介绍了控制器的设计,以及串行和并行核心测试指令的体系结构配置。使用相同的策略可以实现其他指令。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信
小红书