Device fabrication using crystalline CdTe and CdTe ternary alloys grown by MBE

K. Zaunbrecher, J. Burst, S. Seyedmohammadi, R. Malik, Jian V. Li, T. Gessert, T. Barnes
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引用次数: 1

Abstract

We fabricated epitaxial CdTe:In/CdTe:As homojunction and CdZnTe/CdTe and CdMgTe/CdTe heterojunction devices grown on bulk CdTe substrates in order to study the fundamental device physics of CdTe solar cells. Selection of emitter-layer alloys was based on passivation studies using double heterostructures as well as band alignment. Initial results show significant device integration challenges, including low dopant activation, high resistivity substrates and the development of low-resistance contacts. To date, the highest open-circuit voltage is 715 mV in a CdZnTe/CdTe heterojunction following anneal, while the highest fill factor of 52% was attained in an annealed CdTe homojunction. In general, all currentvoltage measurements show high series resistance, capacitancevoltages measurements show variable doping, and quantum efficiency measurements show low collection. Ongoing work includes overcoming the high resistance in these devices and addressing other possible device limitations such as non-optimum junction depth, interface recombination, and reduced bulk lifetime due to structural defects.
用MBE生长的CdTe晶体和CdTe三元合金制备器件
为了研究CdTe太阳能电池的基本器件物理特性,我们在大块CdTe衬底上制备了外延CdTe:In/CdTe:As异质结和CdZnTe/CdTe和CdMgTe/CdTe异质结器件。发射层合金的选择是基于双异质结构和带取向的钝化研究。最初的结果显示了显著的器件集成挑战,包括低掺杂激活、高电阻基底和低电阻触点的发展。迄今为止,CdZnTe/CdTe异质结退火后的最高开路电压为715 mV,而退火后的CdTe异质结的最高填充系数为52%。总的来说,所有的电流电压测量都显示出高串联电阻,电容演化测量显示出可变掺杂,量子效率测量显示出低收集。目前正在进行的工作包括克服这些器件中的高电阻,并解决其他可能的器件限制,如非最佳结深度,界面重组以及由于结构缺陷导致的体积寿命缩短。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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