A Radiation Hardened Nano-Power 8Mb SRAM in 130nm CMOS

Mark Lysinger, F. Jacquet, M. Zamanian, David McClure, P. Roche, Nihar Ranjan Sahoo, J. Russell
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引用次数: 14

Abstract

An eight megabit rad hard SRAM, implemented in 130 nm CMOS technology, uses stacked capacitors within the memory cell for robustness, supply power gating and internally developed array power supplies to achieve very low soft error rates and standby current consumption under 600 nA.
基于130nm CMOS的抗辐射纳米功率8Mb SRAM
采用130纳米CMOS技术实现的8兆rad硬SRAM,在存储单元内使用堆叠电容器实现鲁棒性,提供电源门控和内部开发的阵列电源,以实现非常低的软错误率和低于600 nA的待机电流消耗。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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