The Bandwidth Limitation of De-Embedding Technique for Microstrip Line Measurement

Abstract

With the advancement of radio frequency and semiconductor technologies, circuit operating frequencies have increased, and their areas have decreased. Therefore, many circuits require embedded fixtures for measurement, leading to increased difficulty in measuring high-frequency circuits. As a result, various measurement techniques have been developed, with 2x-Thru automatic fixture removal (AFR) being the most common and widely used. However, as operating frequencies continue to increase, the measurement bandwidth of this technique has reached its limit, necessitating the urgent need to expand the measurement bandwidth through new methods. In this paper, we propose an algorithm for such a technique, identify potential reasons that may limit measurement bandwidth, and validate our approach through both actual measurements and simulation results.