Performance Variability and Analog Behaviors of Memristive Devices with New Transition Metal Carbide

Fei Gao, X. Gong, Yufeng Guo, X. Lian, Yi Tong, Yihao Chen, Yuefeng Li, Miaocheng Zhang, Yu Wang, Nan He, Xinyi Shen, Ertao Hu, Xiang Wan
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Abstract

Physical realization of electrical synapses with good reliability aroused great interest due to rapid development of neuromorphic computing. Meanwhile, a new family of two-dimensional transition metal carbides (TMC) has exhibited great potential in performance improvement of electronic devices. However, there are very few investigations for performing synaptic devices using transition metal carbides. Moreover, reliability is crucial for achieving good biological plasticity as well as a controllable synaptic system. In this work, synaptic devices with transition metal carbide were successfully fabricated and reliability has been studied in details. Resistance window of memristor has been able to achieve 7 orders, which provides a possible solution in building artificial neural networks with accurate and efficient learning capability.
新型过渡金属碳化物记忆电阻器件的性能变异性和模拟行为
由于神经形态计算的迅速发展,具有良好可靠性的电突触的物理实现引起了人们的极大兴趣。同时,一类新的二维过渡金属碳化物(TMC)在提高电子器件性能方面显示出巨大的潜力。然而,使用过渡金属碳化物制作突触装置的研究很少。此外,可靠性对于实现良好的生物可塑性和可控制的突触系统至关重要。本文成功制备了过渡金属碳化物突触器件,并对其可靠性进行了详细的研究。忆阻器的电阻窗口可以达到7阶,为构建具有准确高效学习能力的人工神经网络提供了一种可能的解决方案。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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