Current Scalability Issues in Multi-Bank 5V PMOS ESD structures: Root cause and Design Guideline

Abstract

In this work, a unique Human Body Model (HBM) failure is presented in 5V-PMOS multi-finger structures. The failure is sensitive to the multi-bank layout, generally used to achieve higher holding voltage. Missing Transmission Line Pulse (TLP) failure current (It2) scalability is detected with pulse width, in multi-bank structures and a correlation is established with lower HBM failure. A detailed 3D- TCAD analysis approach is used to understand the PMOS turn-on in the single-bank and multi-bank structures, in turn, the It2 scalability for longer pulse width. The obtained insights are used to provide design guidelines for developing robust PMOS devices.