{"title":"Line stability indices for voltage collapse prediction","authors":"C. Reis, A. Andrade, F.P. Maciel","doi":"10.1109/POWERENG.2009.4915210","DOIUrl":null,"url":null,"abstract":"Voltage collapse is a problem that occurs in heavily stressed systems. This paper compares the effectiveness of line stability indices in providing information about the proximity of voltage instability of a electrical power system. Line voltage stability indices can provide an accurate information of the stability condition of the lines of the system and can also determine the weakest bus in the system. The studied line stability indices are evaluated using the IEEE 14, IEEE 30 and IEEE 57 busbar test systems and, in this paper, will be shown the potential applications of these indices.","PeriodicalId":246039,"journal":{"name":"2009 International Conference on Power Engineering, Energy and Electrical Drives","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-03-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"24","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 International Conference on Power Engineering, Energy and Electrical Drives","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/POWERENG.2009.4915210","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 24
Abstract
Voltage collapse is a problem that occurs in heavily stressed systems. This paper compares the effectiveness of line stability indices in providing information about the proximity of voltage instability of a electrical power system. Line voltage stability indices can provide an accurate information of the stability condition of the lines of the system and can also determine the weakest bus in the system. The studied line stability indices are evaluated using the IEEE 14, IEEE 30 and IEEE 57 busbar test systems and, in this paper, will be shown the potential applications of these indices.