Total dose response of Maxim analog multiplexers at two dose rates

1997 IEEE Radiation Effects Data Workshop NSREC Snowmass 1997. Workshop Record Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference Pub Date : 1997-07-24 DOI:10.1109/REDW.1997.629803

R. Pease, W. Kemp, J. Chavez, N. Islam, W. Shedd

引用次数: 4

Abstract

Samples of MAX338CPE and MAX358CPE 8 channel CMOS analog multiplexers were irradiated at 100 and 0.01 rads/s to a total dose of /spl sim/16 krads. Both part types showed a significant increase in leakage current at a total dose as low as 1-2 krads. The only low dose rate sensitivity was for on-resistance in the MAX358, which appears to be a time dependent effect and not a true dose rate effect.

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Maxim模拟复用器在两种剂量率下的总剂量响应

将MAX338CPE和MAX358CPE 8通道CMOS模拟多路复用器样品分别以100和0.01 rads/s照射至总剂量为/spl sim/16 krads。在总剂量低至1-2克拉时，两种部件类型的泄漏电流均显着增加。唯一的低剂量率敏感性是在MAX358的导通电阻，这似乎是一个时间依赖的效应，而不是一个真正的剂量率效应。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

1997 IEEE Radiation Effects Data Workshop NSREC Snowmass 1997. Workshop Record Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference

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