Fully depleted devices for designers: FDSOI and FinFETs

T. Hook
{"title":"Fully depleted devices for designers: FDSOI and FinFETs","authors":"T. Hook","doi":"10.1109/CICC.2012.6330653","DOIUrl":null,"url":null,"abstract":"Technologies featuring fully depleted transistors are entering the mainstream for designs at the 28nm, 20nm, and 14nm nodes. Although these devices have been the playground of device engineers for more than a decade it is for the most part only recently that they have been introduced to circuit designers and logic chip integrators. The physical structure and many of the features - or lack thereof - of the transistors vis-à-vis conventional planar devices are different, opening some new doors and perhaps closing some old ones. In this paper we discuss both planar (variously called ETSOI/UTBB/FDSOI1) and three-dimensional (variously called FinFET or trigate or doublegate) fully depleted devices, comparing and contrasting them with one another and with classical devices, and in both bulk and SOI manifestations.","PeriodicalId":130434,"journal":{"name":"Proceedings of the IEEE 2012 Custom Integrated Circuits Conference","volume":"162 5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-10-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"33","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the IEEE 2012 Custom Integrated Circuits Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CICC.2012.6330653","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 33

Abstract

Technologies featuring fully depleted transistors are entering the mainstream for designs at the 28nm, 20nm, and 14nm nodes. Although these devices have been the playground of device engineers for more than a decade it is for the most part only recently that they have been introduced to circuit designers and logic chip integrators. The physical structure and many of the features - or lack thereof - of the transistors vis-à-vis conventional planar devices are different, opening some new doors and perhaps closing some old ones. In this paper we discuss both planar (variously called ETSOI/UTBB/FDSOI1) and three-dimensional (variously called FinFET or trigate or doublegate) fully depleted devices, comparing and contrasting them with one another and with classical devices, and in both bulk and SOI manifestations.
专为设计人员设计的全耗尽器件:FDSOI和finfet
在28nm、20nm和14nm节点的设计中,采用全耗尽晶体管的技术正在成为主流。尽管十多年来这些器件一直是器件工程师的游乐场,但直到最近,它们才被引入电路设计师和逻辑芯片集成商。与-à-vis传统平面器件相比,晶体管的物理结构和许多特征(或缺乏特征)是不同的,这打开了一些新的大门,也可能关闭了一些旧的大门。在本文中,我们讨论了平面(各种称为ETSOI/UTBB/FDSOI1)和三维(各种称为FinFET或三栅极或双栅极)全耗尽器件,比较和对比它们彼此和与经典器件,并在体积和SOI表现。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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