High resolution flash time-to-digital converter with sub-picosecond measurement capabilities

Abstract

The paper presents a flash TDC implemented in a UMC 0.13 um technology node. The maximum resolution of 0.6 ps and a dynamic range of plusmn17 ps makes it ideal for measuring set-up and hold time violations and quantifying clock jitter. The method proposed has the effect of reducing the errors introduced by noise and process variations by a factor of two over present techniques. A novel method for overcoming the effects of process variability by counting the number of high outputs is also presented.