Stencil printing process development for low cost flip chip interconnect

Li Li, S. Wiegele, P. Thompson, R. Lee
{"title":"Stencil printing process development for low cost flip chip interconnect","authors":"Li Li, S. Wiegele, P. Thompson, R. Lee","doi":"10.1109/ECTC.1998.678728","DOIUrl":null,"url":null,"abstract":"Traditional methods for forming flip chip interconnection include evaporation and electroplating. While both options have proven performance records, their costs are too high for many of today's cost-sensitive applications. Motorola AISL (Advanced Interconnect Systems Laboratory) developed a low cost flip chip interconnect alternative, which electroless plates Ni/Au as the under bump metallurgy (UBM), deposits solder paste using a stencil or photoresist mask, and reflows the paste to form solder bumps. This paper is focused on the stencil print process development for wafer solder bumping. Solder paste selection, characterization, stencil design, and process parameter optimization are critical factors for successful fine pitch stencil printing. Fine mesh eutectic solder pastes (Type 5: -500+635, Type 6: -635) with different flux vehicles were evaluated for printability and reflow studies. Paste and flux modification and co-development with vendors for this specific application were conducted. An optimal paste, with specified viscosity and desired print, reflow and cleaning behavior, was developed. Wafer stencil design rules were established to deposit the right amount of solder paste to form the required reflowed solder bump height without bridges between pads. Printing and reflow design of experiments were performed to establish the baseline and optimum process parameters. Solder bump characterizations, including bump height and uniformity, composition, shear force, and SEM bump profile and cross section microstructure analysis, were conducted. Development and characterization results are presented.","PeriodicalId":422475,"journal":{"name":"1998 Proceedings. 48th Electronic Components and Technology Conference (Cat. No.98CH36206)","volume":"27 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1998-05-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"20","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1998 Proceedings. 48th Electronic Components and Technology Conference (Cat. No.98CH36206)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECTC.1998.678728","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 20

Abstract

Traditional methods for forming flip chip interconnection include evaporation and electroplating. While both options have proven performance records, their costs are too high for many of today's cost-sensitive applications. Motorola AISL (Advanced Interconnect Systems Laboratory) developed a low cost flip chip interconnect alternative, which electroless plates Ni/Au as the under bump metallurgy (UBM), deposits solder paste using a stencil or photoresist mask, and reflows the paste to form solder bumps. This paper is focused on the stencil print process development for wafer solder bumping. Solder paste selection, characterization, stencil design, and process parameter optimization are critical factors for successful fine pitch stencil printing. Fine mesh eutectic solder pastes (Type 5: -500+635, Type 6: -635) with different flux vehicles were evaluated for printability and reflow studies. Paste and flux modification and co-development with vendors for this specific application were conducted. An optimal paste, with specified viscosity and desired print, reflow and cleaning behavior, was developed. Wafer stencil design rules were established to deposit the right amount of solder paste to form the required reflowed solder bump height without bridges between pads. Printing and reflow design of experiments were performed to establish the baseline and optimum process parameters. Solder bump characterizations, including bump height and uniformity, composition, shear force, and SEM bump profile and cross section microstructure analysis, were conducted. Development and characterization results are presented.
低成本倒装芯片互连的模板印刷工艺开发
形成倒装芯片互连的传统方法包括蒸发和电镀。虽然这两种选择都有可靠的性能记录,但对于当今许多对成本敏感的应用程序来说,它们的成本太高了。摩托罗拉AISL(高级互连系统实验室)开发了一种低成本的倒装芯片互连替代方案,该方案采用化学镀镍/Au板作为凹凸下冶金(UBM),使用模板或光刻胶掩膜沉积锡膏,并将锡膏回流形成锡点。本文主要研究了硅片焊料碰撞的模板打印工艺开发。锡膏的选择、表征、模板设计和工艺参数优化是细间距模板印刷成功的关键因素。采用不同的助焊剂对细网共晶焊膏(5型:-500+635,6型:-635)的可印刷性和回流研究进行了评估。浆料和助焊剂的改性以及与供应商共同开发这一特定应用。开发了一种具有指定粘度和理想的印刷、回流和清洁性能的最佳浆料。建立了硅片模板设计规则,以沉积适量的锡膏,形成所需的回流焊凸高度,而焊盘之间没有桥接。进行了打印和回流设计实验,以确定基准和最佳工艺参数。对焊料凸点进行了表征,包括凸点高度和均匀性、成分、剪切力、SEM凸点轮廓和截面显微组织分析。介绍了开发和表征结果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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