A fast test to generate flash memory threshold voltage distribution map

Raju Khubchandani
{"title":"A fast test to generate flash memory threshold voltage distribution map","authors":"Raju Khubchandani","doi":"10.1109/MTDT.1999.782687","DOIUrl":null,"url":null,"abstract":"This paper describes a method to determine threshold voltage (V/sub th/) distribution as a multi-colored bitmap of the die. That is, a visual indication of relative threshold voltages on different areas of the die is provided. The spatial distribution of threshold voltage is felt to be more informative than conventional techniques which provide results as a bell-curve Gauss distribution plot of threshold voltage versus number of cells. The time required for test execution (including data gathering) is considerably less than the time taken by conventional methods.","PeriodicalId":166999,"journal":{"name":"Records of the 1999 IEEE International Workshop on Memory Technology, Design and Testing","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-08-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Records of the 1999 IEEE International Workshop on Memory Technology, Design and Testing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MTDT.1999.782687","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3

Abstract

This paper describes a method to determine threshold voltage (V/sub th/) distribution as a multi-colored bitmap of the die. That is, a visual indication of relative threshold voltages on different areas of the die is provided. The spatial distribution of threshold voltage is felt to be more informative than conventional techniques which provide results as a bell-curve Gauss distribution plot of threshold voltage versus number of cells. The time required for test execution (including data gathering) is considerably less than the time taken by conventional methods.
快速测试生成闪存阈值电压分布图
本文描述了一种以多色位图的方式确定阈值电压(V/sub /)分布的方法。也就是说,提供了在模具不同区域上的相对阈值电压的视觉指示。阈值电压的空间分布被认为比传统技术提供的阈值电压随细胞数的钟形曲线高斯分布图更有信息量。测试执行所需的时间(包括数据收集)比传统方法所花费的时间要少得多。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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