Overview of Various Failures of Luminaires Assembled with SMD LED Chips

D. Bušek, K. Dušek
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引用次数: 1

Abstract

This work describes common mistakes that are present in luminaires with light emitting diodes (LED) and suggests possible solutions or rather procedures and points that cannot be omitted during both luminaires manufacture and usage. LED packaging is designed to provide mechanical support, electrical connection, thermal management, spectral transformation, and optical control to the LED dies [1]. The LED chip package therefore brings a large variety of reliability issues that are described in the following work. The quality of wirebonds on an LED with soft chip encapsulant was negatively affected during placement. This is minimized when the setting of the machine is optimal, but further handling must also use softer approach when compared to LED chips with hard shell. Mismatch in coefficient of thermal expansion (CTE) also played a significant role in reliability due to fractures in solder joints as our measurement showed and the improper thermal design caused deterioration in the optics that further led to overheating. Several studies were conducted on the reliability calculations, taking into account theoretical or manufacturer declared properties of various LED chips or high power LED chip arrays [2], [3] or whole lighting system including the driver electronics (calculating with initial power consumption, efficiency of the optical system etc., trying to estimate remaining useful life of the entire system [4], [5]. However, real life situations bring into play other, usually unexpected factors such as improper handling.
SMD LED芯片组装灯具的各种故障概述
本工作描述了在使用发光二极管(LED)的灯具中存在的常见错误,并提出了可能的解决方案,或者更确切地说,在灯具制造和使用过程中不能忽略的程序和要点。LED封装旨在为LED封装[1]提供机械支持、电气连接、热管理、光谱变换和光学控制。因此,LED芯片封装带来了各种各样的可靠性问题,这些问题将在下面的工作中描述。软芯片封装LED的线键质量在放置过程中受到负面影响。当机器设置为最佳时,这是最小化的,但与硬壳LED芯片相比,进一步处理也必须使用更柔和的方法。正如我们的测量显示的那样,由于焊点断裂,热膨胀系数(CTE)的不匹配也对可靠性起着重要作用,并且不适当的热设计导致光学元件恶化,从而进一步导致过热。考虑到各种LED芯片或大功率LED芯片阵列[2],[3]或整个照明系统(包括驱动电子设备)的理论或制造商声明的特性(计算初始功耗,光学系统的效率等),对可靠性计算进行了几项研究,试图估计整个系统[4],[5]的剩余使用寿命。然而,现实生活中也会有其他意想不到的因素,比如处理不当。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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