{"title":"Fully delay testable sequential circuits and problem of their structural minimization","authors":"A. Matrosova, E. Mitrofanov","doi":"10.1109/BEC.2014.7320564","DOIUrl":null,"url":null,"abstract":"The method of a sequential circuit design based on using a mixed description of a circuit behavior is considered. A combinational part of a sequential circuit is examined. Its behavior is represented with a composition of ROBDD-graphs and monotonous products. The method provides fully delay testability of a combinational part of a sequential circuit. It is oriented to cut down the path lengths of the obtained circuits. Experimental results are given that demonstrate advantages of the method. The possibilities of further structural minimization of the circuits are discussed.","PeriodicalId":348260,"journal":{"name":"2014 14th Biennial Baltic Electronic Conference (BEC)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 14th Biennial Baltic Electronic Conference (BEC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/BEC.2014.7320564","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
The method of a sequential circuit design based on using a mixed description of a circuit behavior is considered. A combinational part of a sequential circuit is examined. Its behavior is represented with a composition of ROBDD-graphs and monotonous products. The method provides fully delay testability of a combinational part of a sequential circuit. It is oriented to cut down the path lengths of the obtained circuits. Experimental results are given that demonstrate advantages of the method. The possibilities of further structural minimization of the circuits are discussed.