Collection efficiency of CdZnTe detectors

Abstract

In this work, the detection of signal charge produced by X-rays incident on resistive CdZnTe semiconductor substrates, at different detector geometries, within the X-ray diagnostic energy range, is investigated. The experimental results suggest that the observed signal-to-noise ratio is dependent upon the choice of the polarizing electrode that is directly exposed to the incident X-ray beam. An efficient charge defection is achieved achieved when the X-ray beam is incident on the negative electrode with the electric field parallel to the direction of the incoming photons.