Pulse durability of thin-film resistors embedded in printed circuit boards

2011 International Students and Young Scientists Workshop "Photonics and Microsystems" Pub Date : 2011-07-08 DOI:10.1109/STYSW.2011.6155846

A. Kłossowicz, P. Winiarski, A. Dziedzic

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引用次数: 3

Abstract

The passives (resistors, capacitors, inductors) embedded in printed circuit boards (PCBs) can improve electrical properties and reliability of electronic systems. Pulse durability is an important parameter of passive components and active devices. In the case of resistors it allows to determine many properties including maximum power dissipation, resistance change or phenomena occurring in resistor structures after pulse surging. Furthermore pulse durability defines utility for pulse circuits. Thus this work presents pulse durability of thin-film resistors made on the surface or embedded in Printed Circuit Boards. Investigated test structures were made of nickel-phosphorus (Ni-P) alloy on FR-4 laminate with sheet resistance 25 Ω/sq or 100 Ω/sq. Pulse durability was determined by calculating the maximum nondestructive electric field, maximum nondestructive surface power density or maximum nondestructive volume power density. These parameters were determined in dependence on pulse duration, resistor geometry (length, width, aspect ratio), type of cladding, laser trimming and accelerated aging process.

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嵌入印刷电路板的薄膜电阻器的脉冲耐久性

在印刷电路板(pcb)中嵌入无源(电阻、电容、电感)可以改善电子系统的电气性能和可靠性。脉冲耐久性是无源器件和有源器件的重要参数。在电阻器的情况下，它允许确定许多特性，包括最大功率耗散，电阻变化或脉冲涌动后电阻结构中发生的现象。此外，脉冲耐久性定义了脉冲电路的效用。因此，这项工作提出了表面制作或嵌入在印刷电路板上的薄膜电阻器的脉冲耐久性。所研究的试验结构是在FR-4层压板上用镍磷(Ni-P)合金制成，片材电阻分别为25 Ω/sq和100 Ω/sq。脉冲耐久性通过计算最大无损电场、最大无损表面功率密度或最大无损体积功率密度来确定。这些参数的确定取决于脉冲持续时间、电阻几何形状(长度、宽度、长宽比)、熔覆类型、激光修整和加速老化过程。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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2011 International Students and Young Scientists Workshop "Photonics and Microsystems"

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