Wavelength detection using narrowband reflectance filters

N. Ganesh, A. Xiang, N.B. Beltran, D. W. Dobbs, B. Cunningham
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引用次数: 0

Abstract

We have developed a novel system to detect the wavelength of an optical beam that is compact, inexpensive, yet capable of extremely high wavelength resolution. The system is comprised of a one- dimensional photonic crystal slab (PCS) narrowband reflectance filter operating as a position sensitive sensor and a linear charge-coupled device (CCD) sensor array. Depending on the wavelength of the incident light, the PCS provides a transmission minimum at different locations along its length, as shown in Fig. 1. The position of the transmission minimum is recorded by the CCD sensor array and is used to determine the incident wavelength. Using this technique, we show that wavelength changes as small as 0.011 nm can be resolved. Such a system could be utilized for a wide variety of applications including spectroscopic identification of compounds and rapid testing of light emitters such as light emitting diodes (LEDs) and Organic LEDs, in a compact and economical fashion.
波长检测使用窄带反射滤波器
我们已经开发出一种新型系统来检测光束的波长,该系统结构紧凑,价格低廉,但具有极高的波长分辨率。该系统由作为位置敏感传感器的一维光子晶体板(PCS)窄带反射滤波器和线性电荷耦合器件(CCD)传感器阵列组成。根据入射光的波长,PCS沿其长度在不同位置提供最小传输量,如图1所示。传输最小值的位置由CCD传感器阵列记录,并用于确定入射波长。利用这种技术,我们发现可以分辨小到0.011 nm的波长变化。这样的系统可以用于各种各样的应用,包括化合物的光谱识别和快速测试发光二极管(led)和有机led,以紧凑和经济的方式。
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