{"title":"Rapid Failure Analysis of Installed LED Luminaire Through Standardized Processes","authors":"J. Hegedüs, G. Hantos, P. Szabó, A. Poppe","doi":"10.1109/THERMINIC52472.2021.9626528","DOIUrl":null,"url":null,"abstract":"Market competition, human and economic expectations fundamentally determine today’s technical products. In the development of electronic devices, an attractive exterior is now almost as an important requirement as the technical content itself. Expanding the available features, improving product-specific efficiencies, more favorable customer prices and, of course, increasing reliability are also key considerations; however, the latter does not always change in the expected direction.In this paper, we present a complex test procedure for discovering the causes of lifetime problems encountered in a recently \"LEDified\" lighting system of an office building, along with all measurement and computer-aided modeling and simulation methods that can be used to uncover thermal related issues in LED luminaires. Non-contact methods such as visual, infrared and luminance measurements, computer aided thermal simulations, laboratory and in-situ measurements based on thermal transient testing were used, many of them developed in the prior Delphi4LED H2020 ECSEL project.","PeriodicalId":302492,"journal":{"name":"2021 27th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-09-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 27th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/THERMINIC52472.2021.9626528","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Market competition, human and economic expectations fundamentally determine today’s technical products. In the development of electronic devices, an attractive exterior is now almost as an important requirement as the technical content itself. Expanding the available features, improving product-specific efficiencies, more favorable customer prices and, of course, increasing reliability are also key considerations; however, the latter does not always change in the expected direction.In this paper, we present a complex test procedure for discovering the causes of lifetime problems encountered in a recently "LEDified" lighting system of an office building, along with all measurement and computer-aided modeling and simulation methods that can be used to uncover thermal related issues in LED luminaires. Non-contact methods such as visual, infrared and luminance measurements, computer aided thermal simulations, laboratory and in-situ measurements based on thermal transient testing were used, many of them developed in the prior Delphi4LED H2020 ECSEL project.