A 3-Terminal HV-ESD Protection as Specialized Solution for EDn-MOSTs that Directly Link Two External Pads

Abstract

This paper describes ESD design around EDn-MOST devices that connect directly between different I/O pads. In this topology, a trade-off exists between drain voltage and maximum allowable current density through the EDn-MOST. The disclosed ESD device, the 3-terminal HV-ESD, avoids that trade-off and so increases design freedom.