An efficient eye-diagram determination technique for multi-coupled interconnect lines

Abstract

A new, accurate, and efficient eye-diagram determination technique for multi-coupled interconnect lines is proposed. All the switching-dependent step responses are analytically determined, followed by eye-height, jitter, and worst-case eye-diagram for inter-symbol-interference (ISI). In addition, the proposed technique generates the worst-case input patterns of the worst-case eye-diagram. The accuracy and efficiency of the proposed technique is verified with a test circuit using 3-coupled lines.