R. Fornari, C. Frigeri, J. Weyher, S. Krawczyk, F. Krafft, G. Mignoni
{"title":"Microdefect Studies of Fe-Doped Semi-Insulating Inp","authors":"R. Fornari, C. Frigeri, J. Weyher, S. Krawczyk, F. Krafft, G. Mignoni","doi":"10.1109/SIM.1992.752674","DOIUrl":null,"url":null,"abstract":"Different microdefects have been identified in Fe-doped semi-insulating InP: i) very small defects located on dislocations, ii) relatively large precipitates embedded in the matrix, surrounded by a spherical volume depleted of iron, iii) large inclusions in the heavily doped crystal tails. Investigations of these defects by Photoetching, Scanning Photoluminescence, SEM and TEM suggest that: i) the large inclusions are due to incorporation of second-phase particles (FeP, FeP2) which form in the melt as it becomes very rich in iron, ii) the matrix precipitates are possibly the result of iron gathering around a collection point, iii) the small defects are different, in nature, from those containing iron and thought to be either very small precipitates or microloops.","PeriodicalId":368607,"journal":{"name":"Proceedings of the 7th Conference on Semi-insulating III-V Materials,","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-04-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 7th Conference on Semi-insulating III-V Materials,","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SIM.1992.752674","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
Different microdefects have been identified in Fe-doped semi-insulating InP: i) very small defects located on dislocations, ii) relatively large precipitates embedded in the matrix, surrounded by a spherical volume depleted of iron, iii) large inclusions in the heavily doped crystal tails. Investigations of these defects by Photoetching, Scanning Photoluminescence, SEM and TEM suggest that: i) the large inclusions are due to incorporation of second-phase particles (FeP, FeP2) which form in the melt as it becomes very rich in iron, ii) the matrix precipitates are possibly the result of iron gathering around a collection point, iii) the small defects are different, in nature, from those containing iron and thought to be either very small precipitates or microloops.