Challenges and advances in use-condition-based mechanical reliability test development

L. Mercado, S. Sahasrabudhe, E. Monroe
{"title":"Challenges and advances in use-condition-based mechanical reliability test development","authors":"L. Mercado, S. Sahasrabudhe, E. Monroe","doi":"10.1109/EPTC.2003.1298762","DOIUrl":null,"url":null,"abstract":"With rapid advances in the electronic packaging technology, reliability tests based on field conditions have become essential to the package reliability assessment. This paper discusses some major challenges and recent advances in both the assembly and end use condition characterizations and reliability test development.","PeriodicalId":201404,"journal":{"name":"Fifth International Conference onElectronic Packaging Technology Proceedings, 2003. ICEPT2003.","volume":"32 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Fifth International Conference onElectronic Packaging Technology Proceedings, 2003. ICEPT2003.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPTC.2003.1298762","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

With rapid advances in the electronic packaging technology, reliability tests based on field conditions have become essential to the package reliability assessment. This paper discusses some major challenges and recent advances in both the assembly and end use condition characterizations and reliability test development.
基于工况的机械可靠性试验发展的挑战与进展
随着电子封装技术的飞速发展,基于现场条件的可靠性测试已成为封装可靠性评估的必要手段。本文讨论了在装配和最终使用条件表征以及可靠性测试发展方面的一些主要挑战和最新进展。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信