{"title":"Challenges and advances in use-condition-based mechanical reliability test development","authors":"L. Mercado, S. Sahasrabudhe, E. Monroe","doi":"10.1109/EPTC.2003.1298762","DOIUrl":null,"url":null,"abstract":"With rapid advances in the electronic packaging technology, reliability tests based on field conditions have become essential to the package reliability assessment. This paper discusses some major challenges and recent advances in both the assembly and end use condition characterizations and reliability test development.","PeriodicalId":201404,"journal":{"name":"Fifth International Conference onElectronic Packaging Technology Proceedings, 2003. ICEPT2003.","volume":"32 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Fifth International Conference onElectronic Packaging Technology Proceedings, 2003. ICEPT2003.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPTC.2003.1298762","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
With rapid advances in the electronic packaging technology, reliability tests based on field conditions have become essential to the package reliability assessment. This paper discusses some major challenges and recent advances in both the assembly and end use condition characterizations and reliability test development.