A Novel Method to Realize Soft Defect Localization Techniques without a Synchronization Signal for Failure Analysis

2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits Pub Date : 2009-07-06 DOI:10.1109/IPFA.2009.5232662

Wu Chunlei, L. Zhai, M. Motohiko, Jonathon Liu, H. Ma, John Liu

引用次数: 8

Abstract

Failure analysis on advanced logic and mixed signal ICs more and more has to deal with so called ‘soft defect’. In this paper, a novel method to realize Soft Defect Localization (SDL) techniques without a synchronization signal for failure analysis is presented. We will present experimental results showing the accuracy of this method in order to help failure analysis to localize defect in short time.

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一种不需要同步信号的故障分析软缺陷定位方法

在高级逻辑和混合信号集成电路的故障分析中，越来越多地需要处理所谓的“软缺陷”。提出了一种无需同步信号即可实现软缺陷定位(SDL)的方法。我们将提供实验结果来证明该方法的准确性，以帮助故障分析在短时间内定位缺陷。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits

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