An active 90nm inductive signal noise testchip with realistic microprocessor signal buses

Abstract

A 90nm inductance test chip that includes active drivers and on-die noise capture capabilities has been fabricated and measured in silicon. The purpose of the test chip was to quantify the inductive and capacitive noise effects on realistic microprocessor signal lines using typical inter-repeater lengths and signal-to-voltage-rail ratios. Measured results showed that signal inductive noise can potentially contend with capacitive noise and, in double-wide structures, can be of a greater effect than capacitive noise