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Optimized Redundancy Selection Based On Failure-related Yield Model For 64Mb DRAM And Beyond

1991 IEEE International Solid-State Circuits Conference. Digest of Technical Papers Pub Date : 1900-01-01 DOI:10.1109/ISSCC.1991.689082
S. Kikuda, H. Miyamoto, S. Mori, M. Niiro, M. Yarrada
{"title":"Optimized Redundancy Selection Based On Failure-related Yield Model For 64Mb DRAM And Beyond","authors":"S. Kikuda, H. Miyamoto, S. Mori, M. Niiro, M. Yarrada","doi":"10.1109/ISSCC.1991.689082","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":360958,"journal":{"name":"1991 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","volume":"14 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1991 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSCC.1991.689082","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7
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基于失效相关良率模型的64Mb及以上DRAM的优化冗余选择
本文章由计算机程序翻译，如有差异，请以英文原文为准。
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1991 IEEE International Solid-State Circuits Conference. Digest of Technical Papers
1991 IEEE International Solid-State Circuits Conference. Digest of Technical Papers
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