Transmission Line Pulse Method with Arbitrary Characteristic Impedance for Immunity Evaluation of ESD Protection Device

Kyousuke Tanaka, T. Matsushima, Y. Fukumoto
{"title":"Transmission Line Pulse Method with Arbitrary Characteristic Impedance for Immunity Evaluation of ESD Protection Device","authors":"Kyousuke Tanaka, T. Matsushima, Y. Fukumoto","doi":"10.1109/ICSJ52620.2021.9648864","DOIUrl":null,"url":null,"abstract":"In a conventional TLP system, the pulse disturbance is applied to the DUT via the transmission line, whose characteristic impedance is $50\\ \\Omega$. However, the DUT for the evaluation, such as an ESD protection device, may be affected by the transmission line's characteristic impedance. This paper adds an impedance matching circuit to the conventional $50\\ \\Omega$ TLP system, making it possible to adjust the circuit to an arbitrary value of the transmission line's characteristic impedance. By using the developed system, the I-V characteristics of an ESD protection device are evaluated when the characteristic impedance is $20\\ \\Omega,\\ 50\\ \\Omega$, and $150\\ \\Omega$. As a result, it was found that the negative resistance characteristics after the breakdown voltage change depending on the transmission line's characteristic impedance.","PeriodicalId":191859,"journal":{"name":"2021 IEEE CPMT Symposium Japan (ICSJ)","volume":"3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-11-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE CPMT Symposium Japan (ICSJ)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICSJ52620.2021.9648864","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

In a conventional TLP system, the pulse disturbance is applied to the DUT via the transmission line, whose characteristic impedance is $50\ \Omega$. However, the DUT for the evaluation, such as an ESD protection device, may be affected by the transmission line's characteristic impedance. This paper adds an impedance matching circuit to the conventional $50\ \Omega$ TLP system, making it possible to adjust the circuit to an arbitrary value of the transmission line's characteristic impedance. By using the developed system, the I-V characteristics of an ESD protection device are evaluated when the characteristic impedance is $20\ \Omega,\ 50\ \Omega$, and $150\ \Omega$. As a result, it was found that the negative resistance characteristics after the breakdown voltage change depending on the transmission line's characteristic impedance.
用任意特性阻抗的传输线脉冲法评估ESD保护器件的抗扰度
在传统的TLP系统中,脉冲扰动通过传输线施加到被测件上,传输线的特性阻抗为$50\ \Omega$。但是,用于评估的被测件(如ESD保护装置)可能会受到传输线特性阻抗的影响。本文在传统的$50\ \Omega$ TLP系统上增加了阻抗匹配电路,使电路可以调整为传输线特性阻抗的任意值。利用所开发的系统,对特性阻抗为$20\ \Omega$、$ 50\ \Omega$和$150\ \Omega$时的ESD保护器件的I-V特性进行了评估。结果发现,击穿电压后的负电阻特性随传输线的特性阻抗而变化。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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