Phase Field Modeling of Ghost Diffusion in Sn-Ag-Cu Solder Joints

Naveen Weerasekera, Siyu Cao, Dawa Ram Shingdon
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引用次数: 2

Abstract

In this paper, we have introduced a phase field modeling technique to simulate ghost diffusion phenomena of intermetallic compounds in a bulk mettalic matrix phase. We  used Zenner-Frank phase field approach to define free energy density functional which is to be evolved using Chan-Hilliard and Alan-Chan equations to simulate time evolution of the precipitates. We verified our simulation results with intermetallic compound growth of Sn-Ag-Cu solder joints in isothermal aging process attributing to the diffusion of Ag3Sn intermetallic compound. Herewith we present that Zenner-Frank model demonstrates sound validity and provides a best understanding of such phenomena.
Sn-Ag-Cu焊点幽灵扩散的相场模拟
本文介绍了一种相场模拟技术来模拟金属间化合物在大块金属基体相中的幽灵扩散现象。我们使用Zenner-Frank相场方法定义了自由能密度泛函,并利用Chan-Hilliard方程和Alan-Chan方程来模拟析出相的时间演化。在等温时效过程中,由于Ag3Sn金属间化合物的扩散,Sn-Ag-Cu焊点的金属间化合物生长验证了模拟结果。在此,我们提出,Zenner-Frank模型证明了良好的有效性,并提供了最好的理解这种现象。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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