{"title":"First principles methods for defects: state-of-the-art and emerging approaches","authors":"E. Ertekin, H. Raebiger","doi":"10.1049/pbcs045e_ch7","DOIUrl":null,"url":null,"abstract":"This chapter describes typical approaches and levels of approximation and the common sources of uncertainties encountered. On one hand, it provides a generalized framework for carrying out defect calculations. On the other hand, it is intended as a guide to experimentalists how to read theory papers, assess conclusions, and interact with theorists.","PeriodicalId":247105,"journal":{"name":"Characterisation and Control of Defects in Semiconductors","volume":"37 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-09-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Characterisation and Control of Defects in Semiconductors","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1049/pbcs045e_ch7","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
This chapter describes typical approaches and levels of approximation and the common sources of uncertainties encountered. On one hand, it provides a generalized framework for carrying out defect calculations. On the other hand, it is intended as a guide to experimentalists how to read theory papers, assess conclusions, and interact with theorists.