DFT and on-line test of high-performance data converters: a practical case

Proceedings of the Third International Workshop on Design of Mixed-Mode Integrated Circuits and Applications (Cat. No.99EX303) Pub Date : 1999-07-28 DOI:10.1109/MMICA.1999.833602

E. Peralías, A. Rueda, J. A. Prieto, J. Huertas

引用次数: 6

Abstract

This paper discusses a Design-for-Testability (DFT) technique applicable to pipelined Analog-to-Digital Converters (ADC). The objective of this DFT is to improve both the on- and off-line testability of these important mixed-signal ICs.

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DFT与高性能数据转换器的在线测试:一个实际案例

本文讨论了一种适用于流水线模数转换器(ADC)的可测试性设计(DFT)技术。该DFT的目标是提高这些重要混合信号集成电路的在线和离线可测试性。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Proceedings of the Third International Workshop on Design of Mixed-Mode Integrated Circuits and Applications (Cat. No.99EX303)

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