Exploring Power Savings of Gate-All-Around Cryogenic Technology

V. Moroz, A. Svizhenko, Munkang Choi, P. Asenov, Jaehyun Lee
{"title":"Exploring Power Savings of Gate-All-Around Cryogenic Technology","authors":"V. Moroz, A. Svizhenko, Munkang Choi, P. Asenov, Jaehyun Lee","doi":"10.23919/VLSITechnologyandCir57934.2023.10185420","DOIUrl":null,"url":null,"abstract":"Operating CMOS circuits at cryogenic temperatures is becoming the most promising way to reduce power consumption of server farms [1–5]. This becomes possible by drastically reducing power supply voltage Vdd due to the steep subthreshold slope at low temperatures, avoiding 60 mV per decade “Boltzmann curse”. A key factor for reducing Vdd is a tight variability, which is enabled by the GAA (Gate-All-Around) technology [6–8]. In this work, we explore possible reduction of power consumption by operating GAA logic circuits at cryogenic temperatures. Besides, we estimate the combined power consumption of logic at cryogenic temperatures and the power required for cooling it.","PeriodicalId":317958,"journal":{"name":"2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-06-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/VLSITechnologyandCir57934.2023.10185420","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

Operating CMOS circuits at cryogenic temperatures is becoming the most promising way to reduce power consumption of server farms [1–5]. This becomes possible by drastically reducing power supply voltage Vdd due to the steep subthreshold slope at low temperatures, avoiding 60 mV per decade “Boltzmann curse”. A key factor for reducing Vdd is a tight variability, which is enabled by the GAA (Gate-All-Around) technology [6–8]. In this work, we explore possible reduction of power consumption by operating GAA logic circuits at cryogenic temperatures. Besides, we estimate the combined power consumption of logic at cryogenic temperatures and the power required for cooling it.
探索门-全方位低温技术的节能
在低温下操作CMOS电路正成为降低服务器群功耗的最有希望的方法[1-5]。这可以通过大幅降低电源电压Vdd,由于在低温下陡峭的亚阈值斜率,避免每十年60 mV的“玻尔兹曼诅咒”。降低Vdd的一个关键因素是紧密可变性,这是由GAA (gate -全能)技术实现的[6-8]。在这项工作中,我们探索了在低温下操作GAA逻辑电路来降低功耗的可能性。此外,我们估计了在低温下逻辑的综合功耗和冷却所需的功率。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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